Find the tools you need to drive your R&D and innovation projects forward.

Kitmap showcases a wide range of advanced Scientific infrastructure and resources available for R&D and innovation in New Zealand.

Loading...

The Latest Infrastructure and Resources

Search all infrastructure and resources
Resource
zetasizer

Nanoparticle analyser, zeta potential measurement

Zetasizer Pro Blue
An advanced analytical instrument for the characterisation of nanoparticles. The Zetasizer measures two key characteristics of surface properties of particles: hydrodynamic size and surface charge. It uses precise measurement of nanoparticle hydrodynamic size via Dynamic Light Scattering (DLS) and Zeta Potential (an indicator of surface charge), measuring the electrophoretic mobility. It provides valuable insights into colloidal stability and material behaviour.
Combined with other analytical tools available at Scion, such as electron microscopy, confocal fluorescent microscopy, TGA, DSC, and FTIR, we offer a comprehensive package of characterisation services for a wide range of materials.

See details
Resource
DSC 0183

Olympus FV3000 Laser scanning confocal microscope

Inverted microscope with Tokai Hit incubation system for live-cell imaging.
Seven lasers :
• 405 nm
• 445 nm
• 488 nm
• 514 nm
• 561 nm
• 594 nm
• 640 nm

See details
Resource
DSC 0131

TESCAN Clara field emission scanning electron microscope (FE-SEM)

Eight detectors:
• Secondary electron (SE)
• Backscatter (BSE) wide-angle
• In-lens medium angle BSE energy filtered multidetector
• In-lens narrow angle BSE Axial
• Gaseous secondary electron detector (GSD)
• Bright-field scanning-transmission STEM detector
• Dark-field scanning-transmission STEM detector
• Energy-dispersive X-ray spectroscopy (EDS) detector

Multiple Operation Modes:
• Beam deceleration for ultra-low voltage SEM (0.2-2 kV)
• Wide-field imaging for large overviews
• Ultra-high resolution 0.8-1 nm mode at short 1-3 mm working distance
• Variable pressure mode using water vapour or N2 gas
• Cryo-SEM

See details